| Carrier-induced degradation in multicrystalline silicon: Dependence on the silicon nitride passivation layer and hydrogen released during firing C Vargas, K Kim, G Coletti, D Payne, C Chan, S Wenham, Z Hameiri IEEE Journal of Photovoltaics 8 (2), 413-420, 2018 | 123 | 2018 |
| Known-plaintext attack on a joint transform correlator encrypting system JF Barrera, C Vargas, M Tebaldi, R Torroba, N Bolognini Optics letters 35 (21), 3553-3555, 2010 | 101 | 2010 |
| Chosen-plaintext attack on a joint transform correlator encrypting system JF Barrera, C Vargas, M Tebaldi, R Torroba Optics Communications 283 (20), 3917-3921, 2010 | 96 | 2010 |
| Recombination parameters of lifetime-limiting carrier-induced defects in multicrystalline silicon for solar cells C Vargas, Y Zhu, G Coletti, C Chan, D Payne, M Jensen, Z Hameiri Applied Physics Letters 110 (9), 2017 | 87 | 2017 |
| Hydrogen-induced degradation AC née Wenham, S Wenham, R Chen, C Chan, D Chen, B Hallam, ... 2018 IEEE 7th world conference on photovoltaic energy conversion (WCPEC)(A …, 2018 | 80 | 2018 |
| On the impact of dark annealing and room temperature illumination on p-type multicrystalline silicon wafers C Vargas, G Coletti, C Chan, D Payne, Z Hameiri Solar Energy Materials and Solar Cells 189, 166-174, 2019 | 54 | 2019 |
| Impact of dark annealing on the kinetics of light-and elevated-temperature-induced degradation S Liu, D Payne, CV Castrillon, D Chen, M Kim, C Sen, U Varshney, ... IEEE Journal of Photovoltaics 8 (6), 1494-1502, 2018 | 36 | 2018 |
| Degradation and Recovery of n-Type Multi-Crystalline Silicon Under Illuminated and Dark Annealing Conditions at Moderate Temperatures C Vargas, S Nie, D Chen, C Chan, B Hallam, G Coletti, Z Hameiri IEEE Journal of Photovoltaics 9 (2), 355-363, 2018 | 33 | 2018 |
| An advanced software suite for the processing and analysis of silicon luminescence images DNR Payne, C Vargas, Z Hameiri, SR Wenham, DM Bagnall Computer Physics Communications 215, 223-234, 2017 | 32 | 2017 |
| Assessing the defect responsible for LeTID: temperature-and injection-dependent lifetime spectroscopy MA Jensen, Y Zhu, EE Looney, AE Morishige, C Vargas, Z Hameiri, ... 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 3290-3294, 2017 | 13 | 2017 |
| Influence of silicon nitride and its hydrogen content of carrier-induced degradation in multicrystalline silicon C Vargas, K Kim, G Coletti, D Payne, C Chan, S Wenham, Z Hameiri Proc. 33rd Eur. Photovolt. Sol. Energy Conf. Exhib. Amsterdam, 561-564, 2017 | 12 | 2017 |
| Non-interferometric key recording applied to a joint transform cryptosystem C Vargas-Castrillón, A Velez-Zea, JF Barrera-Ramírez Optics Letters 48 (3), 672-675, 2023 | 5 | 2023 |
| Investigating the different degradation behavior of multicrystalline silicon PERC and Al-BSF solar cells M Jensen, HS Laine, Y Zh, C Vargas, Z Liu, JB Li, Z Hameiri, T Buonassisi 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)(A …, 2018 | 2 | 2018 |
| Application of the fractional Fourier transform for decryption in experimental optical cryptosystems C Vargas-Castrillon, A Velez-Zea, JF Barrera-Ramírez Journal of Optics 26 (5), 055601, 2024 | 1 | 2024 |
| Kinetics of the degradation and regeneration of p-type multicrystalline silicon under dark anneal C Vargas, G Coletti, D Payne, C Chan International Conference EU PVSEC for Photovoltaics Research, 24-28 …, 2018 | | 2018 |
| Influence of silicon nitride and its hydrogen content on carrier-induced degradation in multicrystalline silicon G Coletti, C Vargas, C Chan, D Payne, Z Hameiri, K Kim, S Wenham EUPVSEC, Amsterdam, 25-29 september 2017., 2017 | | 2017 |
| ANÁLISIS DEL MOVIMIENTO DE UNA PARTÍCULA EN LABORATORIOS BÁSICOS DE FÍSICA USANDO PROCESAMIENTO DE IMÁGENES EN MATLAB C Vargas, R Castrillon Revista Virtual EDUCyT 11, 2013 | | 2013 |
| Encriptación óptico-digital usando una arquitectura 4f C Vargas, JF Barrera Ramírez, RD Torroba Sociedad Colombiana de Física, 2012 | | 2012 |
| Experimental encryption multiplexing based on a JTC scheme MC Tebaldi, C Vargas, N Bolognini, R Torroba Photonics Letters of Poland 2 (4), 147-149, 2010 | | 2010 |
| Interferometric Measurement of Thickness and Refraction Index on Transparent Thin Films C Vargas, E Tangarife Frontiers in Optics, JWA62, 2010 | | 2010 |
Ziv HameiriProfessor, the University of New South WalesDirección de correo verificada de unsw.edu.au
