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Benjamin Tan
Benjamin Tan
Assistant Professor, University of Calgary
Verified email at ucalgary.ca - Homepage
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Asleep at the Keyboard? Assessing the Security of GitHub Copilot’s Code Contributions
H Pearce, B Ahmad, B Tan, B Dolan-Gavitt, R Karri
2022 IEEE Symposium on Security and Privacy (SP), 754-768, 2022
503*2022
Examining Zero-Shot Vulnerability Repair with Large Language Models
H Pearce, B Tan, B Ahmad, R Karri, B Dolan-Gavitt
2023 IEEE Symposium on Security and Privacy (SP), 1-18, 2022
351*2022
Verigen: A large language model for verilog code generation
S Thakur, B Ahmad, H Pearce, B Tan, B Dolan-Gavitt, R Karri, S Garg
ACM Transactions on Design Automation of Electronic Systems 29 (3), 1-31, 2024
1132024
Benchmarking Large Language Models for Automated Verilog RTL Code Generation
S Thakur, B Ahmad, Z Fan, H Pearce, B Tan, R Karri, B Dolan-Gavitt, ...
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023
1122023
On Hardware Security Bug Code Fixes By Prompting Large Language Models
B Ahmad, S Thakur, B Tan, R Karri, H Pearce
IEEE Transactions on Information Forensics and Security, 2024
86*2024
NNoculation: broad spectrum and targeted treatment of backdoored DNNs
AK Veldanda, K Liu, B Tan, P Krishnamurthy, F Khorrami, R Karri, ...
arXiv preprint arXiv:2002.08313, 2020
79*2020
(Security) Assertions by Large Language Models
R Kande, H Pearce, B Tan, B Dolan-Gavitt, S Thakur, R Karri, J Rajendran
IEEE Transactions on Information Forensics and Security, 2024
71*2024
DAVE: Deriving Automatically Verilog from English
H Pearce, B Tan, R Karri
Proceedings of the 2020 ACM/IEEE Workshop on Machine Learning for CAD, 27–32, 2020
552020
AutoChip: Automating HDL Generation Using LLM Feedback
S Thakur, J Blocklove, H Pearce, B Tan, S Garg, R Karri
arXiv preprint arXiv:2311.04887, 2023
512023
Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking
B Tan, R Karri, N Limaye, A Sengupta, O Sinanoglu, MM Rahman, ...
arXiv preprint arXiv:2006.06806, 2020
432020
Exploring eFPGA-based Redaction for IP Protection
J Bhandari, AKT Moosa, B Tan, C Pilato, G Gore, X Tang, S Temple, ...
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-9, 2021
422021
OpenABC-D: A Large-Scale Dataset For Machine Learning Guided Integrated Circuit Synthesis
AB Chowdhury, B Tan, R Karri, S Garg
arXiv preprint arXiv:2110.11292, 2021
362021
Adversarial Perturbation Attacks on ML-based CAD: A Case Study on CNN-based Lithographic Hotspot Detection
K Liu, H Yang, Y Ma, B Tan, B Yu, EFY Young, R Karri, S Garg
ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020
352020
Pop Quiz! Can a Large Language Model Help With Reverse Engineering?
H Pearce, B Tan, P Krishnamurthy, F Khorrami, R Karri, B Dolan-Gavitt
arXiv preprint arXiv:2202.01142, 2022
282022
Poisoning the (Data) Well in ML-Based CAD: A Case Study of Hiding Lithographic Hotspots
K Liu, B Tan, R Karri, S Garg
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 306-309, 2020
272020
Not all fabrics are created equal: Exploring eFPGA parameters for IP redaction
J Bhandari, AKT Moosa, B Tan, C Pilato, G Gore, X Tang, S Temple, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023
242023
Toward Hardware-Based IP Vulnerability Detection and Post-Deployment Patching in Systems-on-Chip
B Tan, R Elnaggar, JM Fung, R Karri, K Chakrabarty
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
232020
Don't CWEAT It: Toward CWE Analysis Techniques in Early Stages of Hardware Design
B Ahmad, WK Liu, L Collini, H Pearce, JM Fung, J Valamehr, M Bidmeshki, ...
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided …, 2022
212022
Investigating Hiring Bias in Large Language Models
AK Veldanda, F Grob, S Thakur, H Pearce, B Tan, R Karri, S Garg
R0-FoMo: Robustness of Few-shot and Zero-shot Learning in Large Foundation …, 2023
19*2023
ALICE: An automatic design flow for eFPGA redaction
CM Tomajoli, L Collini, J Bhandari, AKT Moosa, B Tan, X Tang, ...
Proceedings of the 59th ACM/IEEE Design Automation Conference, 781-786, 2022
192022
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