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Co-authors
- I-Ting WangTaiwan Semiconductor Research Institute, NARLabsVerified email at narlabs.org.tw
- Chung Wei HsuDepartment of Electronics Engineering, National Chiao Tung UniversityVerified email at nctu.edu.tw
- Boris HudecInstitute of Electrical Engineering, Slovak Academy of SciencesVerified email at savba.sk
- Chih-Cheng ChangInstitute of Information Science, Academia SinicaVerified email at iis.sinica.edu.tw
- Lain-Jong LiUniversity of Hong KongVerified email at hku.hk
- Tian Sheuan ChangNational Yang Ming Chiao Tung UniversityVerified email at nycu.edu.tw
- Wen-Hao ChangRCAS, Academia Sinica; Department of Electrpphysics, National Yang Ming Chiao Tung UniversityVerified email at nycu.edu.tw
- Udayan GangulyProfessor, Electrical Engineering, IIT BombayVerified email at ee.iitb.ac.in
- Chun-Li LoPurdue UniversityVerified email at purdue.edu
- Jiann ShiehDept. Mat. Sci. Eng., National United University, TaiwanVerified email at nuu.edu.tw
- H.-S. Philip WongProfessor of Electrical Engineering, Stanford UniversityVerified email at stanford.edu
- Teyuh ChouUniversity of Michigan, Ann ArborVerified email at umich.edu
- Shimeng YuGeorgia Institute of Technology, Dean's ProfessorVerified email at ece.gatech.edu
- Hassan RazaClemson University, CFRVerified email at clemson.edu
- Chadwin D. YoungUniversity of Texas at DallasVerified email at utdallas.edu
- Eduard A CartierIBM Research, T. J. Watson Research CenterVerified email at us.ibm.com
- Tien Sheng ChaoNational Yang Ming Chiao Tung UniversityVerified email at nycu.edu.tw
- Joel BarnettTokyo ElectronVerified email at us.tel.com
- Pai-Yu ChenArizona State UniversityVerified email at asu.edu
- Shantanu RajwadeGraduate Student, Cornell UniversityVerified email at cornell.edu
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Tuo-Hung (Alex) Hou
Institute of Electronics; National Yang Ming Chiao Tung University
Verified email at nycu.edu.tw