| A deep learning model for identification of defect patterns in semiconductor wafer map Y Yuan-Fu 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2019 | 54 | 2019 |
| Semiconductor defect detection by hybrid classical-quantum deep learning YF Yang, M Sun Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2022 | 29 | 2022 |
| Double feature extraction method for wafer map classification based on convolution neural network Y Yuan-Fu, S Min 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2020 | 17 | 2020 |
| A Novel Deep Learning Architecture for Global Defect Classification: Self-Proliferating Neural Network (SPNet) YF Yang, M Sun 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2021 | 6 | 2021 |
| Semiconductor defect pattern classification by self-proliferation-and-attention neural network Y Yang, M Sun IEEE Transactions on Semiconductor Manufacturing 35 (1), 16-23, 2021 | 4 | 2021 |
| Hybrid quantum-classical machine learning for lithography hotspot detection YF Yang, M Sun 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2022 | 2 | 2022 |
| Medium. Permeation: SARS-COV-2 Painting Creation by Generative Model YF Yang, IK Fang, M Sun, SC Hsu arXiv preprint arXiv:2304.11354, 2023 | | 2023 |
| QRF: Implicit Neural Representations with Quantum Radiance Fields. YF Yang, M Sun CoRR, 2022 | | 2022 |
| Ion Implantation System and Assembly Thereof and Method for Performing Ion Implantation YF Yang TW Patent TWI534,868 B, 2016 | | 2016 |
| Mechanisms for monitoring ion beam in ion implanter system Y Yuan-Fu, C Ping-Fang US Patent 9,293,331, 2016 | | 2016 |
| The Economics of Preventive Maintenance – A Grouping Genetic Algorithm Approach YF Yang, YFD Chiu 2006 36th International Conference on Computers and Industrial Engineering, 2006 | | 2006 |
Min SunChief AI Scientist at Appier Inc. and Associate Professor at National Tsing Hua University, EE dept在 ee.nthu.edu.tw 的電子郵件地址已通過驗證
