| Substrate crosstalk reduction using SOI technology JP Raskin, A Viviani, D Flandre, JP Colinge IEEE Transactions on electron devices 44 (12), 2252-2261, 1997 | 415 | 1997 |
| Low temperature implementation of dopant-segregated band-edge metallic S/D junctions in thin-body SOI p-MOSFETs G Larrieu, E Dubois, R Valentin, N Breil, F Danneville, G Dambrine, ... 2007 IEEE International Electron Devices Meeting, 147-150, 2007 | 310 | 2007 |
| Raman and XPS characterization of vanadium oxide thin films with temperature F Ureña-Begara, A Crunteanu, JP Raskin Applied Surface Science 403, 717-727, 2017 | 309 | 2017 |
| Arsenic-segregated rare-earth silicide junctions: Reduction of Schottky barrier and integration in metallic n-MOSFETs on SOI G Larrieu, DA Yarekha, E Dubois, N Breil, O Faynot IEEE Electron Device Letters 30 (12), 1266-1268, 2009 | 298 | 2009 |
| New substrate passivation method dedicated to HR SOI wafer fabrication with increased substrate resistivity D Lederer, JP Raskin IEEE Electron Device Letters 26 (11), 805-807, 2005 | 297 | 2005 |
| Fabrication method of so1 semiconductor devices D Fladre, A De Mevergnies, JP Raskins US Patent App. 10/471,847, 2004 | 281 | 2004 |
| Influence of device engineering on the analog and RF performances of SOI MOSFETs V Kilchytska, A Neve, L Vancaillie, D Levacq, S Adriaensen, H van Meer, ... IEEE Transactions on Electron Devices 50 (3), 577-588, 2003 | 274 | 2003 |
| Identification of RF harmonic distortion on Si substrates and its reduction using a trap-rich layer DC Kerr, JM Gering, TG McKay, MS Carroll, CR Neve, JP Raskin 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF …, 2008 | 188 | 2008 |
| Fully-depleted SOI CMOS for analog applications JP Colinge IEEE Transactions on Electron Devices 45 (5), 1010-1016, 1998 | 177 | 1998 |
| Semiconductor-on-insulator materials for nanoelectronics applications A Nazarov, JP Colinge, F Balestra, JP Raskin, F Gamiz, VS Lysenko Springer Berlin Heidelberg, 2011 | 175 | 2011 |
| Substrate loss mechanisms for microstrip and CPW transmission lines on lossy silicon wafers D Lederer, JP Raskin Solid-State Electronics 47 (11), 1927-1936, 2003 | 173 | 2003 |
| A 94-GHz aperture-coupled micromachined microstrip antenna GP Gauthier, JP Raskin, LPB Katehi, GM Rebeiz IEEE Transactions on Antennas and Propagation 47 (12), 1761-1766, 1999 | 170 | 1999 |
| Low-temperature wafer bonding: a study of void formation and influence on bonding strength XX Zhang, JP Raskin Journal of microelectromechanical systems 14 (2), 368-382, 2005 | 166 | 2005 |
| Junctionless transistors: physics and properties JP Colinge, CW Lee, N Dehdashti Akhavan, R Yan, I Ferain, P Razavi, ... Semiconductor-on-insulator materials for nanoelectronics applications, 187-200, 2011 | 164 | 2011 |
| Inter-and intragranular plasticity mechanisms in ultrafine-grained Al thin films: An in situ TEM study F Mompiou, M Legros, A Boé, M Coulombier, JP Raskin, T Pardoen Acta materialia 61 (1), 205-216, 2013 | 162 | 2013 |
| Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling JP Raskin, R Gillon, J Chen, D Vanhoenacker-Janvier, JP Colinge IEEE Transactions on Electron Devices 45 (5), 1017-1025, 1998 | 153 | 1998 |
| Micromachined thin-film sensors for SOI-CMOS co-integration J Laconte, D Flandre, JP Raskin Springer Science & Business Media, 2006 | 150 | 2006 |
| Analog/RF performance of multiple gate SOI devices: wideband simulations and characterization JP Raskin, TM Chung, V Kilchytska, D Lederer, D Flandre IEEE Transactions on Electron Devices 53 (5), 1088-1095, 2006 | 150 | 2006 |
| Effective resistivity of fully-processed SOI substrates D Lederer, JP Raskin Solid-State Electronics 49 (3), 491-496, 2005 | 146 | 2005 |
| New on-chip nanomechanical testing laboratory-applications to aluminum and polysilicon thin films S Gravier, M Coulombier, A Safi, N André, A Boé, JP Raskin, T Pardoen Journal of microelectromechanical systems 18 (3), 555-569, 2009 | 138 | 2009 |
Denis FlandreICTEAM, EPL, Université catholique de Louvain (UCL)在 uclouvain.be 的電子郵件地址已通過驗證
