Fabrication of MoS 2 thin film transistors via selective-area solution deposition methods Y Xi, MI Serna, L Cheng, Y Gao, M Baniasadi, R Rodriguez-Davila, J Kim, ... Journal of Materials Chemistry C 3 (16), 3842-3847, 2015 | 54 | 2015 |
A new integration-based procedure to extract the threshold voltage, the mobility enhancement factor, and the series resistance of thin-film MOSFETs R Rodriguez-Davila, A Ortiz-Conde, C Avila-Avendano, ... IEEE Transactions on Electron Devices 66 (7), 2979-2985, 2019 | 17 | 2019 |
Nanocrystalline ZnO TFTs Using 15-nm Thick Al2O3Gate Insulator: Experiment and Simulation RA Chapman, RA Rodriguez-Davila, I Mejia, M Quevedo-Lopez IEEE Transactions on Electron Devices 63 (10), 3936-3943, 2016 | 13 | 2016 |
Bioelectronics on mammalian collagen S Moreno, J Keshtkar, RA Rodriguez‐Davila, A Bazaid, H Ibrahim, ... Advanced Electronic Materials 6 (8), 2000391, 2020 | 12 | 2020 |
Performance and reliability comparison of ZnO and IGZO thin-film transistors and inverters fabricated at a maximum process temperature of 115° C RA Rodriguez-Davila, I Mejia, RA Chapman, CD Young, ... IEEE Transactions on Electron Devices 66 (9), 3861-3866, 2019 | 11 | 2019 |
Quantum confinement and interface states in ZnO nanocrystalline thin-film transistors RA Chapman, RA Rodriguez-Davila, WG Vandenberghe, CL Hinkle, ... IEEE Transactions on Electron Devices 65 (5), 1787-1795, 2018 | 9 | 2018 |
Effect of dielectric thickness and annealing on threshold voltage instability of low temperature deposited high-k oxides on ZnO TFTs CD Young, R Campbell, S Daasa, S Benton, RR Davila, I Mejia, ... 2015 IEEE International Integrated Reliability Workshop (IIRW), 34-36, 2015 | 7 | 2015 |
On the DC extraction of the asymmetric parasitic source and drain resistances for MOSFETs R Rodriguez-Davila, A Ortiz-Conde, C Avila-Avendano, Z Shamsi, ... Solid-State Electronics 164, 107700, 2020 | 6 | 2020 |
Impact of Al2O3 deposition temperature on the performance and initial stability of nanocrystalline ZnO thin-film transistors RA Rodriguez-Davila, RA Chapman, P Bolshakov, CD Young, ... Microelectronic Engineering 217, 111114, 2019 | 6 | 2019 |
Hot carrier stress investigation of zinc oxide thin film transistors with an Al2O3 gate dielectric RA Rodriguez-Davila, I Mejia, M Quevedo-Lopez, CD Young 2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018 | 5 | 2018 |
Energy storage performance in lead-free antiferroelectric 0.92 (Bi0. 54Na0. 46) TiO3-0.08 BaTiO3 ultrathin films by pulsed laser deposition JJ Serralta-Macías, RA Rodriguez-Davila, M Quevedo-Lopez, D Olguín, ... Journal of Vacuum Science & Technology A 40 (3), 2022 | 4 | 2022 |
Low temperature, highly stable ZnO thin-film transistors RA Rodriguez-Davila, RA Chapman, ZH Shamsi, SJ Castillo, CD Young, ... Microelectronic Engineering 279, 112063, 2023 | 3 | 2023 |
Understanding the effects of low-temperature passivation and annealing on ZnO TFTs test structures RA Rodriguez-Davila, P Bolshakov, CD Young, M Quevedo-Lopez 2019 IEEE 32nd International Conference on Microelectronic Test Structures …, 2019 | 2 | 2019 |
Electrical characteristics of lead-free Mn-doped BiFeO3–SrTiO3 thin films deposited on silicon substrate using pulsed laser deposition JJ Serralta-Macías, RA Rodriguez-Davila, M Quevedo-Lopez, D Olguín, ... Journal of Materials Science: Materials in Electronics 33 (24), 19272-19283, 2022 | 1 | 2022 |
Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3 RA Rodriguez-Davila, RA Chapman, M Catalano, M Quevedo-Lopez, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 1 | 2020 |
Relatively low-temperature processing and its impact on device performance and reliability CD Young, P Bolshakov, RAR Davila, P Zhao, C Smyth, ... ECS Transactions 90 (1), 89, 2019 | 1 | 2019 |
Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric P Bolshakov, RA Rodriguez-Davila, M Quevedo-Lopez, CD Young 2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019 | 1 | 2019 |
Oxide Based Field Effect Transistors for Large Area Radiation Detection Electronics RA Rodriguez Davila | 1 | 2019 |
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation RA Rodriguez-Davila, L Fernandez-Izquierdo, J Fink, T Moise, ... 2024 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2024 | | 2024 |
Scalable 10B Powder Backfilling Process for Large-Area High-Efficiency Microstructured Thermal Neutron Detectors ZH Shamsi, R Rodriguez-Davila, L Fernandez-Izquierdo, ... ACS Applied Engineering Materials 1 (6), 1676-1683, 2023 | | 2023 |