追蹤
Rodolfo Rodriguez
Rodolfo Rodriguez
Research Scientist at UTDallas
在 utdallas.edu 的電子郵件地址已通過驗證
標題
引用次數
引用次數
年份
Fabrication of MoS 2 thin film transistors via selective-area solution deposition methods
Y Xi, MI Serna, L Cheng, Y Gao, M Baniasadi, R Rodriguez-Davila, J Kim, ...
Journal of Materials Chemistry C 3 (16), 3842-3847, 2015
542015
A new integration-based procedure to extract the threshold voltage, the mobility enhancement factor, and the series resistance of thin-film MOSFETs
R Rodriguez-Davila, A Ortiz-Conde, C Avila-Avendano, ...
IEEE Transactions on Electron Devices 66 (7), 2979-2985, 2019
172019
Nanocrystalline ZnO TFTs Using 15-nm Thick Al2O3Gate Insulator: Experiment and Simulation
RA Chapman, RA Rodriguez-Davila, I Mejia, M Quevedo-Lopez
IEEE Transactions on Electron Devices 63 (10), 3936-3943, 2016
132016
Bioelectronics on mammalian collagen
S Moreno, J Keshtkar, RA Rodriguez‐Davila, A Bazaid, H Ibrahim, ...
Advanced Electronic Materials 6 (8), 2000391, 2020
122020
Performance and reliability comparison of ZnO and IGZO thin-film transistors and inverters fabricated at a maximum process temperature of 115° C
RA Rodriguez-Davila, I Mejia, RA Chapman, CD Young, ...
IEEE Transactions on Electron Devices 66 (9), 3861-3866, 2019
112019
Quantum confinement and interface states in ZnO nanocrystalline thin-film transistors
RA Chapman, RA Rodriguez-Davila, WG Vandenberghe, CL Hinkle, ...
IEEE Transactions on Electron Devices 65 (5), 1787-1795, 2018
92018
Effect of dielectric thickness and annealing on threshold voltage instability of low temperature deposited high-k oxides on ZnO TFTs
CD Young, R Campbell, S Daasa, S Benton, RR Davila, I Mejia, ...
2015 IEEE International Integrated Reliability Workshop (IIRW), 34-36, 2015
72015
On the DC extraction of the asymmetric parasitic source and drain resistances for MOSFETs
R Rodriguez-Davila, A Ortiz-Conde, C Avila-Avendano, Z Shamsi, ...
Solid-State Electronics 164, 107700, 2020
62020
Impact of Al2O3 deposition temperature on the performance and initial stability of nanocrystalline ZnO thin-film transistors
RA Rodriguez-Davila, RA Chapman, P Bolshakov, CD Young, ...
Microelectronic Engineering 217, 111114, 2019
62019
Hot carrier stress investigation of zinc oxide thin film transistors with an Al2O3 gate dielectric
RA Rodriguez-Davila, I Mejia, M Quevedo-Lopez, CD Young
2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018
52018
Energy storage performance in lead-free antiferroelectric 0.92 (Bi0. 54Na0. 46) TiO3-0.08 BaTiO3 ultrathin films by pulsed laser deposition
JJ Serralta-Macías, RA Rodriguez-Davila, M Quevedo-Lopez, D Olguín, ...
Journal of Vacuum Science & Technology A 40 (3), 2022
42022
Low temperature, highly stable ZnO thin-film transistors
RA Rodriguez-Davila, RA Chapman, ZH Shamsi, SJ Castillo, CD Young, ...
Microelectronic Engineering 279, 112063, 2023
32023
Understanding the effects of low-temperature passivation and annealing on ZnO TFTs test structures
RA Rodriguez-Davila, P Bolshakov, CD Young, M Quevedo-Lopez
2019 IEEE 32nd International Conference on Microelectronic Test Structures …, 2019
22019
Electrical characteristics of lead-free Mn-doped BiFeO3–SrTiO3 thin films deposited on silicon substrate using pulsed laser deposition
JJ Serralta-Macías, RA Rodriguez-Davila, M Quevedo-Lopez, D Olguín, ...
Journal of Materials Science: Materials in Electronics 33 (24), 19272-19283, 2022
12022
Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3
RA Rodriguez-Davila, RA Chapman, M Catalano, M Quevedo-Lopez, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020
12020
Relatively low-temperature processing and its impact on device performance and reliability
CD Young, P Bolshakov, RAR Davila, P Zhao, C Smyth, ...
ECS Transactions 90 (1), 89, 2019
12019
Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric
P Bolshakov, RA Rodriguez-Davila, M Quevedo-Lopez, CD Young
2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019
12019
Oxide Based Field Effect Transistors for Large Area Radiation Detection Electronics
RA Rodriguez Davila
12019
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation
RA Rodriguez-Davila, L Fernandez-Izquierdo, J Fink, T Moise, ...
2024 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2024
2024
Scalable 10B Powder Backfilling Process for Large-Area High-Efficiency Microstructured Thermal Neutron Detectors
ZH Shamsi, R Rodriguez-Davila, L Fernandez-Izquierdo, ...
ACS Applied Engineering Materials 1 (6), 1676-1683, 2023
2023
系統目前無法執行作業,請稍後再試。
文章 1–20